Reduces Measurement Time and Improves Production Efficiency
  • Measurement of passive optical devices in <0.2s(5nm) reduces total analysis time
  • Dedicated applications for evaluating active optical devices
  • Excellent cost performance
  • Dynamic range performance ≥60 dB (0.4 nm from peak wavelength)
  • 30 pm minimum resolution bandwidth
  • Supports SM and MM fibers
  • Lightweight, 50% less power consumption


In order to assist us in reducing spam, please type the characters you see:
spam control image
No products found